【精品行业资料】X射线数据手册

VIP免费

3.0 2024-07-24 0 0 8.22MB 969 页 1库币海报

投诉举报

Günter Zschornack

Handbook of X-Ray Data

Günter Zschornack

Handbook

of X-Ray Data

With 113 Figures and 161 Tables

123

Ass.-Prof. Dr. rer. nat. habil. Günter Zschornack

Technische Universität Dresden

Institut für Angewandte Physik

Mommsenstraße 13

01062 Dresden

g.zschornack@fz-rossendorf.de

Library of Congress Control Number: 2006937001

ISBN 978-3-540-28618-9 Springer Berlin Heidelberg New York

This work is subject to copyright. All rights are reserved, whether the whole or part

of the material is concerned, speciﬁcally the rights of translation, reprinting, reuse of

illustrations, recitation, broadcasting, reproduction on microﬁlm or in any other way,

and storage in data banks. Duplication of this publication or parts thereof is permitted

only under the provisions of the German Copyright Law of September 9, 1965, in

its current version, and permission for use must always be obtained from Springer.

Violations are liable for prosecution under the German Copyright Law.

Springer is a part of Springer Science+Business Media

springer.com

The use of general descriptive names, registered names, trademarks, etc. in this publi-

cation does not imply, even in the absence of a speciﬁc statement, that such names are

exempt from the relevant protective laws and regulations and therefore free for general

use.

Typesetting:

Production: LE-T

XJelonek,Schmidt&VöcklerGbR,Leipzig

Cover: WMXDesign, Heidelberg

Printed on acid-free paper 57/3100/YL - 543210

PTP , Berlin GmbH-Berlin

Preface

Today, with energy-dispersive and wavelength-

dispersive techniques, modern methods in X-ray

analysis are used in a wide range of applications, as

for example in X-ray ﬂuorescence analysis, electron

microbeam analysis,X-ray ﬂuorescence analysis with

charged particles, and so on. In many applications –

for instance in metallurgy, mining, microelectronics,

medicine, biology, environmental protection, chem-

istry, archeology, X-ray astronomy, and so on – fast

and effective information about the probes under in-

vestigation can be obtained by simultaneous multi-

element analysis. Therefore, it is of outstanding im-

portance for every analyst to have a carefully edited

collection of basic atomic data. This is also true in

the age of the communication society, where a large

quantity of data is available via the Internet. Practi-

cal experience shows that it is still important to have

data sets in the form of printed matter. This is even

more important, because much of the data available

in the Internet are given without correct citation of

data sources and without any evaluation.

Accurate sets of atomic data are necessary for the

calibration of energy- and wavelength-dispersive X-

ray spectrometers and serve as basic data for appli-

cations in atomic physics, nuclear physics and as-

trophysics,aswellasdatafordiagnosticsandmod-

elling of different plasmas, as for instance in fusion

research and ion source physics.

The present book characterizes, in a compact and

informative form, the most important processes and

facts connected with the emission of X-rays. Be-

ginning with the description of the atomic shell

structure, classification of atomic electron transi-

tions is given, and important details about these

processes are discussed. Subsequently, an overview

of the basic processes of the interaction of X-rays

with matter and of the most common detection

systems for the detection of X-rays are summa-

rized.

Individual sets of experimental atomic data,

known from the literature, are compared between

themselves and with theoretical results. In this way

it becomes possible to reach conclusions about the

consistency of the data sets to be used. In describing

the procedures for energy and intensity calibration of

energy- and wavelength-dispersive X-ray spectrom-

eters, guidance in the application of atomic data for

the calibration of the detection systems to be used

and for transition line identification is given.

The present book fills a gap in the existing sci-

entific literature in a field important for commercial

and technological applications, as well as for basic

and applied research. It is offered to all scientists

and engineers using X-rays in research, technology,

process control, and in other fields. The spectrum

of working areas includes spheres of activity such

as X-ray and solid-state physics, atomic and nuclear

physics,plasma physics,astrophysics,physical chem-

istry, as well as special applications in such fields as

metallurgy, microelectronics, geology, silicate tech-

niques,environment protection,medicine,and so on.

The tables in the present book contain a wide

range of data contributingto the value of the bookby

their easy availability.From my own investigations I

know how costly the search for data can be. During

the writing of this book I have made an effort to sum-

marize all the data in a transparent way. When, for a

certain quantity,different data are known in theliter-

ature, as a rule I have given all known information to

characterize the actual knowledge in a definiteobjec-

VI Preface

tive way. Here, readers should judge for themselves

how successful I have been. I would be grateful to

receive comments from users of the book, in order

to help me improve its conception and content for

further editions.

During the preparation of the first edition pub-

lished in 1989 by Verlag für Grundstoffindustrie,

Leipzig and in the same year as licence edition by

the Springer publishing house, my colleagues Dr.

S.Fritzsche,Dr.I.Reiche,Dipl.-Phys.K.Mädler,Dipl.-

Phys. R. Paul and Dipl.-Phys. J.-U. Uhlenbrok sup-

ported me in different ways. I express my gratitude

to all of them.During the preparation of the new edi-

tion the support given by Dipl.-Phys.G.Beulich,who

updated the extensive data set, was of extraordinary

value. Dr. D. Küchler and Dr. A. El-Shemi, as well as

Dipl.-Phys. T. Werner and Dr. F. Ullmann, gave me a

lot of valuable tips for the improvement of the first

edition. Furthermore, the comprehensive technical

assistance from Mrs. K. Arndt is acknowledged.

Last but not least, my gratitude is directed not

only to those actively contributing to the success of

the present book, but also to those contributing, via

appreciation and passive tolerance, to the finishing

of the present book – my family.

Dresden, October 2006 Günter Zschornack

Contents

Part I Atomic Structure, X-ray Physics and Radiation Detection

1 X-Ray Physics and Practice ........................................................................ 3

1.1 HistoricalDevelopmentofX-RayPhysics.................................................... 3

1.2 SignificanceofAtomicDataforPractice ..................................................... 5

2 Physical Fundamentals ............................................................................ 9

2.1 ElectronicConfigurationsandAtomicGroundStates ........................................ 9

2.1.1 OccupationofElectronicLevels...................................................... 9

2.1.2 SystematicsofElectronEnergyLevels................................................ 11

2.1.3 ElectronShellStructure.............................................................. 22

2.2 CharacteristicX-Rays........................................................................ 24

2.2.1 Classification ........................................................................ 24

2.2.2 LineProfileandLineBroadening..................................................... 36

2.2.3 X-RayEmissionRates................................................................ 46

2.2.4 X-RayEnergyShifts.................................................................. 54

2.3 FluorescenceYields .......................................................................... 74

2.3.1 ImplicationsforBasicResearchandPractice......................................... 74

2.3.2 NotationsandDefinitions............................................................ 74

2.3.3 NaturalLevelWidthsandFluorescenceYields ........................................ 79

2.4 Ionization ................................................................................... 79

2.4.1 ElectronImpactionization........................................................... 79

2.4.2 IonizationinIon–AtomandIon–IonCollisions ...................................... 82

2.4.3 MultipleIonizationProcesses ........................................................ 82

2.5 X-RaySpectraandtheAuger-Effect.......................................................... 86

2.5.1 AugerElectronsandInner-ShellIonization .......................................... 86

2.5.2 Auger Effect and Energetic Width of X-Ray Emission Lines and Absorption Edges . . . 87

2.5.3 AugerEffectandIntensitiesofX-RayEmissionLines................................. 87

2.6 X-RayAtomicScatteringFactors............................................................. 88

2.7 X-RayAbsorption ........................................................................... 88

2.8 ContinuousX-Rays .......................................................................... 91

2.8.1 PropertiesofElectronBremsstrahlung............................................... 93

2.8.2 BremsstrahlungCross-Sections ...................................................... 93

2.8.3 RadiationLengthandRadiationDensity ............................................. 94

2.8.4 ElectronBremsstrahlungfromX-RayTubes.......................................... 94

2.8.5 BremsstrahlungIntensityDistribution ............................................... 95

VIII Contents

2.8.6 PolarizationalBremsstrahlung ....................................................... 96

2.8.7 BremsstrahlungEmissionfromPlasmas ............................................. 96

3 Energy and Intensity Measurements .............................................................. 99

3.1 CalibrationNormalsforElectromagneticRadiation ......................................... 99

3.1.1 ClassificationoftheCalibrationNormals ............................................ 99

3.1.2 X-RayCalibrationNormals .......................................................... 100

3.2 EnergyandIntensityCalibration ............................................................ 103

3.2.1 CalibrationofWavelength-DispersiveSpectrometers................................. 103

3.2.2 CalibrationofEnergy-DispersiveSpectrometers ..................................... 104

3.3 X-RayDetectors ............................................................................. 106

3.3.1 Energy-andWavelength-DispersiveX-RaySpectroscopy............................. 106

3.3.2 GasIonizationDetectors ............................................................. 107

3.3.3 Scintillationdetectors................................................................ 116

3.3.4 SemiconductorDetectors ............................................................ 123

3.3.5 CrystalDiffractionSpectrometers.................................................... 129

3.3.6 CryogenicDetectors ................................................................. 144

4DataBase......................................................................................... 147

4.1 ElectronBindingEnergies ................................................................... 147

4.2 X-RayTransitionEnergies ................................................................... 158

4.2.1 StandardEnergyRange .............................................................. 158

4.2.2 SoftX-RayEnergyRegion............................................................ 163

4.3 X-RayFluorescenceYields ................................................................... 163

4.3.1 K-ShellX-rayﬂuorescenceYields..................................................... 163

4.3.2 LX-RayFluorescenceYields.......................................................... 164

4.3.3 MX-RayFluorescenceYields......................................................... 164

4.4 EnergeticLevelandLinewidths .............................................................. 168

4.5 X-RayEmissionRates ....................................................................... 170

4.6 MassAttenuationCoefficients ............................................................... 173

Part II X-Ray Reference Data

5 X-Ray Emission Lines and Atomic Level Characteristics........................................... 179

6 X-Ray Transition Energies: Ordered by Energy/Wavelength ....................................... 611

7 K-Shell Intensity Ratios and K-Vacancy Decay Rates .............................................. 691

8 Atomic Scattering Factors ......................................................................... 695

9 Analytical approximation of Atomic Scattering Factors ........................................... 723

10 Mass Attenuation Coefficients ..................................................................... 735

11 Fit Parameters for the Calculation of Mass Attenuation Coefficients .............................. 889

Contents IX

12 Atomic Weights and Isotope Masses ............................................................... 909

13 Parameters of Stable Isotopes ..................................................................... 917

14 Parameters of Long-Live RadioactiveIsotopes .................................................... 925

15 Mean X-Ray Transition Energies .................................................................. 943

References ............................................................................................. 953

文档加载中……请稍候！
如果长时间未打开，您也可以点击刷新试试。

亲！下载文档到电脑，查找使用更方便

开通VIP 海量精品免费下载，VIP免费文档当前共计100000+，合计每篇下载不到2厘

1 库币 0人已下载

直接下载 VIP免费下载

标签： #资料

摘要：

GünterZschornackHandbookofX-RayDataGünterZschornackHandbookofX-RayDataWith113Figuresand161Tables123Ass.-Prof.Dr.rer.nat.habil.GünterZschornackTechnischeUniversitätDresdenInstitutfürAngewandtePhysikMommsenstraße1301062Dresdeng.zschornack@fz-rossendorf.deLibraryofCongressControlNumber:2006937001ISBN97...

展开>> 收起<<

【精品行业资料】X射线数据手册.pdf

共969页,预览969页

还剩页未读，继续阅读

温馨提示：66文库网--作为在线文档分享平台，一直注重给大家带来优质的阅读体验；让知识分享变得简单、有价值；海量文档供您查阅下载，让您的工作简单、轻松而高效！ 1. 未经权益所有人同意不得将文件中的内容挪作商业或盈利用途。 2. 66文库网仅提供信息存储空间，仅对广大用户、作者上传内容的表现方式做保护处理，对上传分享的文档内容本身不做任何修改或编辑，并不对下载的任何内容负责。 3. 广大用户、作者上传的文件中如有侵权或不适当内容，请与我们联系，我们立即纠正。 4. 本站不保证、不承担下载资源内容的准确性、安全性和完整性, 同时也不承担用户因使用下载资源对自己和他人造成任何形式的伤害或损失。

【精品行业资料】X射线数据手册

相关推荐

猜您喜欢

举报选择: